Use this url to cite publication: https://hdl.handle.net/20.500.12259/41246
Formation and characteristics of thin films of ZrO2-8 mol % Y2O3 solid electrolytes
Type of publication
Straipsnis Web of Science ir Scopus duomenų bazėje / Article in Web of Science and Scopus database (S1)
Author(s)
Author | Affiliation | |
---|---|---|
LT | ||
Lietuvos energetikos institutas, milcius@mail.lei.lt | LT | |
LT | ||
Title [en]
Formation and characteristics of thin films of ZrO2-8 mol % Y2O3 solid electrolytes
Is part of
Solid state phenomena: diffusion and defect data, Part B
Date Issued
Date | Volume |
---|---|
2004 | 97-98 |
Publisher
Zurich-Uetikon : Trans Tech Publications
Publisher (trusted)
Is Referenced by
Extent
p. 153-158
Abstract (en)
Thin films of ZrO2-8mol % Y2O3 have been deposed by pulsed DC magnetron sputtering method. The substrates of Ni-cermet and alloy-600 for the films were used. The results of the investigation of the X-ray diffraction patterns and SEM showed that the films are nanocrystalline and belong to cubic symmetry. The relaxation process is related to the ion transport in thin films. The results of the investigation of the temperature dependencies of thin films ionic conductivity showed that the dependence (T) is caused by the temperature dependence of oxygen vacancy mobility, while the number of charge carriers remains constant with temperature.
Type of document
type::text::journal::journal article::research article
Language
Anglų / English (en)
Coverage Spatial
Šveicarija / Switzerland (CH)
Description
Self-formation theory and applications : 6th international conference, Vilnius, Lithuania, Nov. 26-28, 2003
ISSN (of the container)
1012-0394
WOS
WOS:000223163200023
Other Identifier(s)
VDU02-000002005
Journal | IF | AIF | AIF (min) | AIF (max) | Cat | AV | Year | Quartile |
---|---|---|---|---|---|---|---|---|
SOLID STATE PHENOMENA | 0.461 | 1.661 | 1.496 | 1.792 | 3 | 0.289 | 2004 | Q3 |
Journal | IF | AIF | AIF (min) | AIF (max) | Cat | AV | Year | Quartile |
---|---|---|---|---|---|---|---|---|
SOLID STATE PHENOMENA | 0.461 | 1.661 | 1.496 | 1.792 | 3 | 0.289 | 2004 | Q3 |