Please use this identifier to cite or link to this item:https://hdl.handle.net/20.500.12259/41246
Type of publication: research article
Type of publication (PDB): Straipsnis Clarivate Analytics Web of Science / Article in Clarivate Analytics Web of Science (S1)
Field of Science: Fizika / Physics (N002)
Author(s): Pranevičius, Liudas;Milčius, Darius;Širvinskaitė, Vaiva;Šalkus, Tomas;Kežionis, Algimantas;Orliukas, Antanas
Title: Formation and characteristics of thin films of ZrO2-8 mol % Y2O3 solid electrolytes
Is part of: Solid state phenomena: Diffusion and defect data, Part B. Zurich-Uetikon, Switzerland : Trans Tech Publications, 2004, Vol. 97-98
Extent: p. 153-158
Date: 2004
Note: [6th International Conference on Self-Formation Theory and Applications Vilnius, Lithuania, Nov. 26-28, 2003]
Keywords: Ionic conductivity;Solid electrolyte;Thin films;Pulsed DC magnetron sputtering
Abstract: Thin films of ZrO2-8mol % Y2O3 have been deposed by pulsed DC magnetron sputtering method. The substrates of Ni-cermet and alloy-600 for the films were used. The results of the investigation of the X-ray diffraction patterns and SEM showed that the films are nanocrystalline and belong to cubic symmetry. The relaxation process is related to the ion transport in thin films. The results of the investigation of the temperature dependencies of thin films ionic conductivity showed that the dependence (T) is caused by the temperature dependence of oxygen vacancy mobility, while the number of charge carriers remains constant with temperature
Internet: https://www.scientific.net/SSP.97-98.153
Affiliation(s): Lietuvos energetikos institutas, milcius@mail.lei.lt
Vilniaus universitetas
Vilniaus universitetas, algimantas.kezionis@ff.vu.lt
Vilniaus universitetas, antanas.orliukas@ff.vu.lt
Vytauto Didžiojo universitetas
Appears in Collections:Universiteto mokslo publikacijos / University Research Publications

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